Scanning Electron Microscope (SEM) Lab

Students working with the ThermoScientific PrismaE Scanning Electron Microscope

ThermoScientific PrismaE Scanning Electron Microscope (SEM) features:

  • Secondary electron detector (ET-SED) for surface morphology imaging

  • Ultra-sensitive, lens-mounted directional backscatter electron detector (DBS) for compositional contrast

  • ThermoScientific Pathfinder EDS UltraDry 60M - Energy Dispersive Spectroscopy (EDS) for semi-quantitative compositional analyses

  • ThermoScientific Pathfinder EBSD Quasor 2 System- Electron Backscatter Diffraction (EBSD) for determining the microstructure of crystalline substances, often for mineral phase identification, grain size distributions, and determination of crystal lattice orientation

  • High vacuum, low vacuum, and variable pressure (e.g. Environmental SEM) modes

  • Peltier heating/cooling stage -20C to +60C

More detailed information about scanning electron microscopy

Inserting material to be scanned by the SEMTypical Applications

  • Polycrystalline textures and orientation, paleontology, anthropology, entomology, igneous petrology, nanotechnology

To schedule time on the SEM, email Nick Deardorff (ndeardorff@iup.edu).

On the day of SEM use, complete the SEM Qualtrics Survey.

Additional Information