Scanning Electron Microscope (SEM) Lab

  • Students working with the ThermoScientific PrismaE Scanning Electron Microscope

    ThermoScientific PrismaE Scanning Electron Microscope (SEM) features:

    • Secondary electron detector (ET-SED) for surface morphology imaging

    • Ultra-sensitive, lens-mounted directional backscatter electron detector (DBS) for compositional contrast 

    • ThermoScientific Pathfinder EDS UltraDry 60M – Energy Dispersive Spectroscopy (EDS) for semi-quantitative compositional analyses

    • ThermoScientific Pathfinder EBSD Quasor 2 System- Electron Backscatter Diffraction (EBSD) for determining the microstructure of crystalline substances, often for mineral phase identification, grain size distributions, and determination of crystal lattice orientation

    • High vacuum, low vacuum, and variable pressure (e.g. Environmental SEM) modes

    • Peltier heating/cooling stage -20°C to +60°C

    More detailed information about scanning electron microscopy

    Inserting material to be scanned by the SEMTypical Applications

    • Polycrystalline textures and orientation, paleontology, anthropology, entomology, igneous petrology, nanotechnology

    To schedule time on the SEM, email Nick Deardorff (ndeardorff@iup.edu).

    On the day of SEM use, complete the SEM Qualtrics Survey.

    Additional Information