Electron Microscopy in Material Characterization

Posted on 2/23/2016 2:37:11 PM

Chunfei Li, from Clarion University of Pennsylvania, will present this seminar on Friday, February 26, at 2:30 p.m., in Weyandt Hall, Room 331.

Electron microscopy is a powerful tool in microstructure characterization. It provides information of atomic arrangement in real and reciprocal spaces. Coupled with Energy Dispersive X-ray Spectroscopy and Electron Energy Loss Spectroscopy, it can also provide elemental and chemical information.

This talk uses some examples to demonstrate such strength of electron microscopy. 

Department of Physics